产品描述:
CMI900 is a cost effective, rapid and high performance XRF analyser for measurement of coating thickness and material composition.
High performance XRF spectrometer
Fast and precise analysis: proportional counter detector and 50 watt micro-focus X-ray tube provide high sensitivity
Simple element differentiation: secondary beam filters enable the spectral separation of overlapping elements
Optimised performance across a wide range of elements: optimised, preset methods of parameters.
CMI900 is supplied with over 800 pre-loaded application parameters/methods
Excellent long-term stability:
Automatic thermal compensation measures the instrument temperature and corrects for changes, giving stable results
Simple and rapid Spectrum Calibration routine checks the instrument performance (such as sensitivity) and
applies necessary corrections
Rugged and robust design
Operation in a lab or by the production line
Sturdy, industrial design
技术参数:
Field-proven technology, with over 3,000 instruments sold worldwide
Electrical and electronic components
Increase productivity with better process control
Component reliability assurance
Solder alloy composition and thickness measurement
Lifetime product assurance through optimised quality control
For example:
Analysis of gold and palladium thickness of electrical contacts
Coating thickness of NiP layer on
computer hard discs