SENDIRA中红外光谱椭偏仪

SENDIRA中红外光谱椭偏仪SE 900-50 红外光谱椭偏仪替代型号

Basics The ellipsometer measures in reflection mode the optical response of a sample using polarized light.
The sample properties change the polarization state of the reflected light. Amplitude ratio and phase difference of the Fresnel reflection coefficients rpand rsare used to investigate material composition, molecule orientation, film thickness and optical constants of single films and layer stacks.

Benefits of SENDIRA IR spectroscopic ellipsometer
Measures two parameters: amplitude ratio and phase differences
Sensitive to mono layers and molecule orientation
Easy sample preparation, no reference sample required
Combines SE with R and T measurements
Large sample analysis, mapping capabilities

Key features
?Wavelength range: 400 cm-1-6000 cm-1
?Separate ellipsometer optics, ellipsometer uses external port of FT-IR instrument
?Complete accessible FT-IR spectrometer
?Large samples, maximal sample size 200 mm diameter, maximal sample height 8 mm
?Ellipsometric, transmission and reflection measurements with polarized light
?Variable incident angle of light (VASE)
?SENTECH comprehensive software for spectroscopic ellipsometry SpectraRay